Study on the Partial Discharge Characteristics and Development Process in Use of the Multiple Discharge Patterns for the Typical Defects in Gas-Insulated Switchgear
Yao, Rui; Si, Gangquan; Zhang, Yanbin; Yuan, Yiwei; Xie, Qian
- 期刊名称Canadian Journal of Electrical and Computer Engineering
- 作者Yao, Rui; Si, Gangquan; Zhang, Yanbin; Yuan, Yiwei; Xie, Qian
- 卷第39卷
- 期第4期
- 印刷ISSN0840-8688
- 文件大小7102.03KB
- 发表时间2016-23
- DOI10.1109/CJECE.2016.2594193
- 页码297-310