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Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure!

Electron-Excited X-Ray Microanalysis at Low Beam Energy: Almost Always an Adventure!

Newbury, Dale E.; Ritchie, Nicholas W.M.

期刊名称Microscopy and Microanalysis
作者Newbury, Dale E.; Ritchie, Nicholas W.M.
卷第22卷
期第4期
印刷ISSN1431-9276
电子ISSN1435-8115
文件大小3495.86KB
发表时间2016-08
DOI10.1017/s1431927616011521
页码735-753

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