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[IEEE 2016 IEEE East-West Design & Test Symposium (EWDTS) - Yerevan, Armenia (2016.10.14-2016.10.17)] 2016 IEEE East-West Design & Test Symposium (EWDTS) - Securing test infrastructure of system-on-chips

[IEEE 2016 IEEE East-West Design & Test Symposium (EWDTS) - Yerevan, Armenia (2016.10.14-2016.10.17)] 2016 IEEE East-West Design & Test Symposium (EWDTS) - Securing test infrastructure of system-on-chips

Tshagharyan, G.; Harutyunyan, G.; Shoukourian, S.; Zorian, Y.

作者Tshagharyan, G.; Harutyunyan, G.; Shoukourian, S.; Zorian, Y.
文件大小242.49KB
发表时间2016
DOI10.1109/EWDTS.2016.7807696
页码1-4

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