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A comparison of scanning methods and the vertical control implications for scanning probe microscopy

A comparison of scanning methods and the vertical control implications for scanning probe microscopy

Teo, Yik R.; Yong, Yuen; Fleming, Andrew J.
  • 期刊名称Asian Journal of Control
  • 作者Teo, Yik R.; Yong, Yuen; Fleming, Andrew J.
  • 印刷ISSN1561-8625
  • 文件大小5284.87KB
  • 发表时间2016
  • DOI10.1002/asjc.1422
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