A comparison of scanning methods and the vertical control implications for scanning probe microscopy
Teo, Yik R.; Yong, Yuen; Fleming, Andrew J.
- 期刊名称Asian Journal of Control
- 作者Teo, Yik R.; Yong, Yuen; Fleming, Andrew J.
- 印刷ISSN1561-8625
- 文件大小5284.87KB
- 发表时间2016
- DOI10.1002/asjc.1422