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[IEEE TENCON 2016 - 2016 IEEE Region 10 Conference - Singapore (2016.11.22-2016.11.25)] 2016 IEEE Region 10 Conference (TENCON) - Development of basic fault model and corresponding ATPG for single input missing cell deposition defects in Majority Voter of QCA

[IEEE TENCON 2016 - 2016 IEEE Region 10 Conference - Singapore (2016.11.22-2016.11.25)] 2016 IEEE Region 10 Conference (TENCON) - Development of basic fault model and corresponding ATPG for single input missing cell deposition defects in Majority Voter of QCA

Dhare, Vaishali; Mehta, Usha
  • 作者Dhare, Vaishali; Mehta, Usha
  • 文件大小370.26KB
  • 发表时间2016
  • DOI10.1109/TENCON.2016.7848451
  • 页码2354-2359
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