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SPIE Proceedings [SPIE Electron Technology Conference ELTE 2016 - Wisla, Poland (Sunday 11 September 2016)] Electron Technology Conference 2016 - Effect of interface traps parameters on admittance characteristics of the MIS (metal-insulator-semiconductor) tunnel structures

SPIE Proceedings [SPIE Electron Technology Conference ELTE 2016 - Wisla, Poland (Sunday 11 September 2016)] Electron Technology Conference 2016 - Effect of interface traps parameters on admittance characteristics of the MIS (metal-insulator-semiconductor) tunnel structures

Swatowska, Barbara; Maziarz, Wojciech; Pisarkiewicz, Tadeusz; Kucewicz, Wojciech; Jasiński, Jakub; Mazurak, Andrzej; Majkusiak, Bogdan
  • 作者Swatowska, Barbara; Maziarz, Wojciech; Pisarkiewicz, Tadeusz; Kucewicz, Wojciech; Jasiński, Jakub; Mazurak, Andrzej; Majkusiak, Bogdan
  • 卷第10175卷
  • 印刷ISSN0277-786X
  • 文件大小1199.83KB
  • 发表时间2016
  • DOI10.1117/12.2261666
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