SPIE Proceedings [SPIE Electron Technology Conference ELTE 2016 - Wisla, Poland (Sunday 11 September 2016)] Electron Technology Conference 2016 - Effect of interface traps parameters on admittance characteristics of the MIS (metal-insulator-semiconductor) tunnel structures
Swatowska, Barbara; Maziarz, Wojciech; Pisarkiewicz, Tadeusz; Kucewicz, Wojciech; Jasiński, Jakub; Mazurak, Andrzej; Majkusiak, Bogdan
- 作者Swatowska, Barbara; Maziarz, Wojciech; Pisarkiewicz, Tadeusz; Kucewicz, Wojciech; Jasiński, Jakub; Mazurak, Andrzej; Majkusiak, Bogdan
- 卷第10175卷
- 印刷ISSN0277-786X
- 文件大小1199.83KB
- 发表时间2016
- DOI10.1117/12.2261666