Speckle-based at-wavelength metrology of X-ray mirrors with super accuracy
- 期刊名称Review of Scientific Instruments
- 作者Kashyap, Yogesh; Wang, Hongchang; Sawhney, Kawal
- 卷第87卷
- 期第5期
- 印刷ISSN0034-6748
- 电子ISSN1089-7623
- 文件大小8273.23KB
- 发表时间2016-05
- DOI10.1063/1.4949004
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