[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Extensive reliability investigation of a-VMCO nonfilamentary RRAM: Relaxation, retention and key differences to filamentary switching
Subhechha, Subhali; Govoreanu, Bogdan; Chen, Yangyin; Clima, Sergiu; De Meyer, Kristin; Van Houdt, Jan; Jurczak, Malgorzata
- 作者Subhechha, Subhali; Govoreanu, Bogdan; Chen, Yangyin; Clima, Sergiu; De Meyer, Kristin; Van Houdt, Jan; Jurczak, Malgorzata
- 文件大小839.88KB
- 发表时间2016
- DOI10.1109/irps.2016.7574568