SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Developments in X-Ray Tomography X - Interior tomography from differential phase contrast data via Hilbert transform based on spline functions

Stock, Stuart R.; Müller, Bert; Wang, Ge; Yang, Qingsong; Cong, Wenxiang; Wang, Ge

作者Stock, Stuart R.; Müller, Bert; Wang, Ge; Yang, Qingsong; Cong, Wenxiang; Wang, Ge
卷第9967卷
印刷ISSN0277-786X
文件大小379.63KB
发表时间2016
DOI10.1117/12.2237818

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