[IEEE 2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT) - Hammamet, Tunisia (2016.12.18-2016.12.20)] 2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT) - Simulation of conducted EMI in SiC MOSFET buck converters before and after aging
- 作者Douzi, Shawki; Tlig, Mohamed; Ben Hadj Slama, Jaleleddine; Kadi, Moncef
- 文件大小468.41KB
- 发表时间2016
- DOI10.1109/SETIT.2016.7939861
- 页码171-176