SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Developments in X-Ray Tomography X - X-ray interior tensor tomography with 2D gratings

Stock, Stuart R.; Müller, Bert; Wang, Ge; Chen, Mianyi; Yang, Qingsong; Cong, Wenxiang; Wei, Biao; Wang, Ge

作者Stock, Stuart R.; Müller, Bert; Wang, Ge; Chen, Mianyi; Yang, Qingsong; Cong, Wenxiang; Wei, Biao; Wang, Ge
卷第9967卷
印刷ISSN0277-786X
文件大小4518.83KB
发表时间2016
DOI10.1117/12.2238408

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