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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Current Developments in Lens Design and Optical Engineering XVII - Some methods for determining the limit of potential image quality of optical systems of various complexities using the database

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Current Developments in Lens Design and Optical Engineering XVII - Some methods for determining the limit of potential image quality of optical systems of various complexities using the database

Johnson, R. Barry; Mahajan, Virendra N.; Thibault, Simon; Bezdidko, S.
  • 作者Johnson, R. Barry; Mahajan, Virendra N.; Thibault, Simon; Bezdidko, S.
  • 卷第9947卷
  • 印刷ISSN0277-786X
  • 文件大小283.43KB
  • 发表时间2016
  • DOI10.1117/12.2237149
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