Electronic origin of strain effects on solute stabilities in iron
Liu, Wei; Li, Xiangyan; Xu, Yichun; Liu, C. S.; Liang, Yunfeng
- 期刊名称Journal of Applied Physics
- 作者Liu, Wei; Li, Xiangyan; Xu, Yichun; Liu, C. S.; Liang, Yunfeng
- 卷第120卷
- 期第7期
- 印刷ISSN0021-8979
- 电子ISSN1089-7550
- 文件大小1450.52KB
- 发表时间2016-08-21
- DOI10.1063/1.4961318