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Quantitative X-ray dark-field and phase tomography using single directional speckle scanning technique

Quantitative X-ray dark-field and phase tomography using single directional speckle scanning technique

Wang, Hongchang; Kashyap, Yogesh; Sawhney, Kawal

期刊名称Applied Physics Letters
作者Wang, Hongchang; Kashyap, Yogesh; Sawhney, Kawal
卷第108卷
期第12期
印刷ISSN0003-6951
电子ISSN1077-3118
文件大小2056.71KB
发表时间2016-03-21
DOI10.1063/1.4944462

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