Occurrence of two-stage hardening in C-Mn steel wire rods containing pearlitic microstructure
- 期刊名称IOP Conference Series: Materials Science and Engineering
- 作者Singh, Balbir; Sahoo, Gadadhar; Saxena, Atul
- 卷第149卷
- 印刷ISSN1757-8981
- 电子ISSN1757-899X
- 文件大小835.47KB
- 发表时间2016-09
- DOI10.1088/1757-899X/149/1/012066
Thermoelectric transport in topological insulatorsTakahashi, Ryuji; Murakami, Shuichi · Semiconductor Science and Technology · 2012
Quantum dot laserLedentsov, N N · Semiconductor Science and Technology · 2011
Atomic layer depositionGodlewski, Marek · Semiconductor Science and Technology · 2012
Interband tunnelling in semiconductor heterostructuresZakharova, A · Semiconductor Science and Technology · 1998
Special issue on GrapheneMorpurgo, Alberto F; Trauzettel, Björn · Semiconductor Science and Technology · 2010
Optical processes in microcavitiesSlusher, R E · Semiconductor Science and Technology · 1994
Progress in topological insulatorsMorpurgo, Alberto; Trauzettel, Björn · Semiconductor Science and Technology · 2012
Quantum well intermixingMarsh, J H · Semiconductor Science and Technology · 1993