Mapping technology space by normalizing patent networks
Alstott, Jeff; Triulzi, Giorgio; Yan, Bowen; Luo, Jianxi
- 期刊名称Scientometrics
- 作者Alstott, Jeff; Triulzi, Giorgio; Yan, Bowen; Luo, Jianxi
- 卷第110卷
- 期第1期
- 印刷ISSN0138-9130
- 电子ISSN1588-2861
- 文件大小5395.35KB
- 发表时间2017-1-27
- DOI10.1007/s11192-016-2107-y
- 页码443-479