Learning moment-based fast local binary descriptor
- 期刊名称Journal of Electronic Imaging
- 作者Bellarbi, Abdelkader; Zenati, Nadia; Otmane, Samir; Belghit, Hayet
- 卷第26卷
- 期第2期
- 印刷ISSN1017-9909
- 文件大小4093.73KB
- 发表时间2017-03-16
- DOI10.1117/1.JEI.26.2.023006
Nanofluidic interfaces in microfluidic networksMillet, Larry J.; Doktycz, Mitchel J.; Retterer, Scott T. · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2015
Electron emission from electrically isolated spheresHolgate, Joshua T.; Coppins, Michael · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2018
Tomographic measurement of buried interface roughnessHayashida, Misa; Ogawa, Shinichi; Malac, Marek · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2015
Scatterometry for nanoimprint lithographyZhu, Ruichao; Brueck, Steven R. J.; Dawson, Noel; Busani, Tito; Joseph, Praveen; Singhal, Shrawan; Sreenivasan, S. V. · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2016
Molecular ionization probability in cluster-SIMSWucher, Andreas · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2018
Camera for transmission He <sup>+</sup> ion microscopyKavanagh, Karen L.; Herrmann, Christoph; Notte, John A. · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2017
Nanodiamond vacuum field emission microtriodeHsu, Shao-Hua; Kang, Weng Poo; Raina, Supil; Howell, Mick; Huang, Jin-Hua · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2017
Dose accumulation and 3D imaging with He <sup>+</sup> ionsGiannuzzi, Lucille A. · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2015