[Conference Proceedings of the Society for Experimental Mechanics Series] Sensors and Instrumentation, Volume 5 || Comparison of Nonlinear System Identification Methods for Free Decay Measurements with Application to MEMS Devices
Wee Sit, Evro; Walber, Chad; Walter, Patrick; Seidlitz, Steve
- 作者Wee Sit, Evro; Walber, Chad; Walter, Patrick; Seidlitz, Steve
- 文件大小937.83KB
- 发表时间2017
- DOI10.1007/978-3-319-54987-3_5
- 页码29-46