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[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Efficient yield optimization method using a variable K-Means algorithm for analog IC sizing

[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Efficient yield optimization method using a variable K-Means algorithm for analog IC sizing

Canelas, Antonio; Martins, Ricardo; Povoa, Ricardo; Lourenco, Nuno; Horta, Nuno
  • 作者Canelas, Antonio; Martins, Ricardo; Povoa, Ricardo; Lourenco, Nuno; Horta, Nuno
  • 文件大小895.83KB
  • 发表时间2017
  • DOI10.23919/DATE.2017.7927171
  • 页码1201-1206
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