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[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Tunnel FET based refresh-free-DRAM

[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Tunnel FET based refresh-free-DRAM

Gupta, Navneet; Makosiej, Adam; Vladimirescu, Andrei; Amara, Amara; Anghel, Costin
  • 作者Gupta, Navneet; Makosiej, Adam; Vladimirescu, Andrei; Amara, Amara; Anghel, Costin
  • 文件大小574.17KB
  • 发表时间2017
  • DOI10.23919/DATE.2017.7927119
  • 页码914-917
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