[IEEE 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Lausanne, Switzerland (2017.3.27-2017.3.31)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 - Robust TSV-based 3D NoC design to counteract electromigration and crosstalk noise
Das, Sourav; Doppa, Janardhan Rao; Pande, Partha Pratim; Chakrabarty, Krishnendu
- 作者Das, Sourav; Doppa, Janardhan Rao; Pande, Partha Pratim; Chakrabarty, Krishnendu
- 文件大小241.56KB
- 发表时间2017
- DOI10.23919/DATE.2017.7927205
- 页码1366-1371