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[IEEE 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Tampa, FL, USA (2017.3.26-2017.3.30)] 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Trade-off between switching loss and common mode EMI generation of GaN devices-analysis and solution

[IEEE 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Tampa, FL, USA (2017.3.26-2017.3.30)] 2017 IEEE Applied Power Electronics Conference and Exposition (APEC) - Trade-off between switching loss and common mode EMI generation of GaN devices-analysis and solution

Han, Di; Li, Silong; Lee, Woongkul; Choi, Wooyoung; Sarlioglu, Bulent

作者Han, Di; Li, Silong; Lee, Woongkul; Choi, Wooyoung; Sarlioglu, Bulent
文件大小728.02KB
发表时间2017
DOI10.1109/apec.2017.7930794
页码843-847

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