High-Temperature RF Material Characterization Using a Dual-Chambered Rectangular Waveguide Fixture
- 期刊名称IEEE Transactions on Instrumentation and Measurement
- 作者Bogle, Andrew E.; Hyde, Milo W.; Havrilla, Michael J.; Sovern, Jeffrey S.
- 印刷ISSN0018-9456
- 电子ISSN1557-9662
- 文件大小1306.69KB
- 发表时间2017
- DOI10.1109/TIM.2017.2700918
- 页码1-6
Optically strobed sampling oscilloscopeLawton, Robert A.; Andrews, James R. · IEEE Transactions on Instrumentation and Measurement · 1976
Strain Gauge Amplifier CircuitsMaundy, Brent; Gift, Stephan J. G. · IEEE Transactions on Instrumentation and Measurement · 2013
Guarding techniques for resistance thermometersCutkosky, Robert D. · IEEE Transactions on Instrumentation and Measurement · 1981
Subnanosecond risetime pulse generatorsNicolson, A. Murray; Cronson, Harry M.; Mitchell, Peter G. · IEEE Transactions on Instrumentation and Measurement · 1976
Fiber-optic sensorsHochberg, Richard C. · IEEE Transactions on Instrumentation and Measurement · 1986
A reflection coefficient bridgeRotholz, Ersch · IEEE Transactions on Instrumentation and Measurement · 1987
Launcher and microstrip characterizationBianco, Bruno; Parodi, Mauro; Ridella, Sandro; Selvaggi, Franco · IEEE Transactions on Instrumentation and Measurement · 1976
Microprocessor-based resistance measurementHaklai, Shai; Erlicki, Michael S. · IEEE Transactions on Instrumentation and Measurement · 1986