SPIE Proceedings [SPIE SPIE Commercial + Scientific Sensing and Imaging - Anaheim, California, United States (Sunday 9 April 2017)] Dimensional Optical Metrology and Inspection for Practical Applications VI - A combined system for 3D printing cybersecurity
- 作者Harding, Kevin G.; Zhang, Song; Straub, Jeremy
- 卷第10220卷
- 印刷ISSN0277-786X
- 文件大小408.51KB
- 发表时间2017
- DOI10.1117/12.2264583
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