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Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV

van Santen, Victor M.; Martin-Martinez, Javier; Amrouch, Hussam; Nafria, Montserrat Maqueda; Henkel, Jorg

期刊名称IEEE Transactions on Circuits and Systems I: Regular Papers
作者van Santen, Victor M.; Martin-Martinez, Javier; Amrouch, Hussam; Nafria, Montserrat Maqueda; Henkel, Jorg
印刷ISSN1549-8328
电子ISSN1558-0806
文件大小2263.87KB
发表时间2017
DOI10.1109/TCSI.2017.2717790
页码1-14