Surface sensitivity of four-probe STM for the measurement of the resistivity of bulk ZnO correlated to XPS

• 期刊名称Journal of Physics: Condensed Matter
• 作者Lord, Alex Mark; Evans, Jon E; Barnett, Chris; Allen, Martin W; Barron, Andrew R; Wilks, Steve
• 印刷ISSN0953-8984
• 电子ISSN1361-648X
• 文件大小1335.94KB
• 发表时间2017-07-05
• DOI10.1088/1361-648X/aa7dc8