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Green’s function-based defect identification in InAs-InAs
<sub/>1-x</sub>
Sb
<sub/>x</sub>
strained layer superlattices

Green’s function-based defect identification in InAs-InAs _1-x Sb _x strained layer superlattices

Krishnamurthy, S.; Yu, Zhi Gang

期刊名称AIP Advances
作者Krishnamurthy, S.; Yu, Zhi Gang
卷第7卷
期第6期
电子ISSN2158-3226
文件大小1131.92KB
发表时间2017-06
DOI10.1063/1.4989564

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