[IEEE 2017 International Conference on Information and Digital Technologies (IDT) - Zilina, Slovakia (2017.7.5-2017.7.7)] 2017 International Conference on Information and Digital Technologies (IDT) - Simulation of conducted EMI in SiC MOSFET buck converters before and after aging
Douzi, Shawki; Tlig, Mohamed; Slama, Jaleleddine Ben Hadj; Kadi, Moncef
- 作者Douzi, Shawki; Tlig, Mohamed; Slama, Jaleleddine Ben Hadj; Kadi, Moncef
- 文件大小468.41KB
- 发表时间2017
- DOI10.1109/DT.2017.8012095
- 页码171-176