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[IEEE 2017 International Conference on Information and Digital Technologies (IDT) - Zilina, Slovakia (2017.7.5-2017.7.7)] 2017 International Conference on Information and Digital Technologies (IDT) - Simulation of conducted EMI in SiC MOSFET buck converters before and after aging

[IEEE 2017 International Conference on Information and Digital Technologies (IDT) - Zilina, Slovakia (2017.7.5-2017.7.7)] 2017 International Conference on Information and Digital Technologies (IDT) - Simulation of conducted EMI in SiC MOSFET buck converters before and after aging

Douzi, Shawki; Tlig, Mohamed; Slama, Jaleleddine Ben Hadj; Kadi, Moncef
  • 作者Douzi, Shawki; Tlig, Mohamed; Slama, Jaleleddine Ben Hadj; Kadi, Moncef
  • 文件大小468.41KB
  • 发表时间2017
  • DOI10.1109/DT.2017.8012095
  • 页码171-176
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