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[IFIP Advances in Information and Communication Technology] VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability Volume 508 || Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors

[IFIP Advances in Information and Communication Technology] VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability Volume 508 || Robust Hybrid TFET-MOSFET Circuits in Presence of Process Variations and Soft Errors

Hollstein, Thomas; Raik, Jaan; Kostin, Sergei; Tšertov, Anton; O'Connor, Ian; Reis, Ricardo
  • 作者Hollstein, Thomas; Raik, Jaan; Kostin, Sergei; Tšertov, Anton; O'Connor, Ian; Reis, Ricardo
  • 文件大小1354.33KB
  • 发表时间2017
  • DOI10.1007/978-3-319-67104-8_3
  • 页码41-59
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