Two-Run RAM March Testing with Address Decimation
Mrozek, Ireneusz; Yarmolik, Vyacheslav
- 期刊名称Journal of Circuits, Systems and Computers
- 作者Mrozek, Ireneusz; Yarmolik, Vyacheslav
- 卷第26卷
- 期第2期
- 印刷ISSN0218-1266
- 电子ISSN1793-6454
- 文件大小217.76KB
- 发表时间2017-02
- DOI10.1142/S0218126617500311