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[IEEE 2017 IEEE Industry Applications Society Annual Meeting - Cincinnati, OH, USA (2017.10.1-2017.10.5)] 2017 IEEE Industry Applications Society Annual Meeting - Characterization of voltage dips and swells in a DG embedded distribution network during and subsequent to islanding process and grid re-connection

[IEEE 2017 IEEE Industry Applications Society Annual Meeting - Cincinnati, OH, USA (2017.10.1-2017.10.5)] 2017 IEEE Industry Applications Society Annual Meeting - Characterization of voltage dips and swells in a DG embedded distribution network during and subsequent to islanding process and grid re-connection

Alam, M. R.; Muttaqi, K. M.; Bouzerdoum, A.
  • 作者Alam, M. R.; Muttaqi, K. M.; Bouzerdoum, A.
  • 文件大小1200.26KB
  • 发表时间2017
  • DOI10.1109/IAS.2017.8101864
  • 页码1-9
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