Portable Electron Microscopy and Microanalysis in Extreme Environments
- 期刊名称Microscopy and Microanalysis
- 作者Own, Christopher S.; Murfitt, Matthew F.; Own, Lawrence S.; Cushing, Jesse; Martinez, James; Thomas-Keprta, Katherine; Pettit, Donald R.
- 卷第23卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小455.42KB
- 发表时间2017-07
- DOI10.1017/s1431927617006079
- 页码1082-1083
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PrefaceThomas F. Kelly; Patrick P. Camus · 1996
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