Quantitative STEM: Comparative Studies of Composition and Optical Properties of Semiconductor Quantum Structures
- 期刊名称Microscopy and Microanalysis
- 作者Rosenauer, Andreas; Fritz Krause, Florian; Müller-Caspary, Knut; Goldmann, Elias; Jahnke, Frank; Paul, Matthias; Jetter, Michael; Michler, Peter; Müller, Marcus; Veit, Peter; Christen, Jürgen; Schimpke, Tilman; Ahl, Jan-Philipp; Avramescu, Adrian; Strassburg, Martin
- 卷第23卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小477.96KB
- 发表时间2017-07
- DOI10.1017/s1431927617009114
- 页码1690-1691
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