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Next Generation Technology-Enhanced Assessment (Global Perspectives on Occupational and Workplace Testing) || Changing Relationships within the Testing Ecosystem

Next Generation Technology-Enhanced Assessment (Global Perspectives on Occupational and Workplace Testing) || Changing Relationships within the Testing Ecosystem

Scott, John C.; Bartram, Dave; Reynolds, Douglas H.

作者Scott, John C.; Bartram, Dave; Reynolds, Douglas H.
文件大小231.03KB
发表时间2017
DOI10.1017/9781316407547.007
页码139-170

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