Next Generation Technology-Enhanced Assessment (Global Perspectives on Occupational and Workplace Testing) || Security of Technology-Enhanced Assessments
Scott, John C.; Bartram, Dave; Reynolds, Douglas H.
- 作者Scott, John C.; Bartram, Dave; Reynolds, Douglas H.
- 文件大小166.81KB
- 发表时间2017
- DOI10.1017/9781316407547.008
- 页码171-192