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[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Revisiting random access scan for effective enhancement of post-silicon observability

[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Revisiting random access scan for effective enhancement of post-silicon observability

Kumar, Binod; Jindal, Ankit; Tudu, Jaynarayan; Pandey, Brajesh; Singh, Virendra
  • 作者Kumar, Binod; Jindal, Ankit; Tudu, Jaynarayan; Pandey, Brajesh; Singh, Virendra
  • 文件大小210.13KB
  • 发表时间2017
  • DOI10.1109/IOLTS.2017.8046208
  • 页码132-137
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