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[IEEE 2017 IEEE East-West Design & Test Symposium (EWDTS) - Novi Sad (2017.9.29-2017.10.2)] 2017 IEEE East-West Design & Test Symposium (EWDTS) - Experimental study on Hamming and Hsiao codes in the context of embedded applications

[IEEE 2017 IEEE East-West Design & Test Symposium (EWDTS) - Novi Sad (2017.9.29-2017.10.2)] 2017 IEEE East-West Design & Test Symposium (EWDTS) - Experimental study on Hamming and Hsiao codes in the context of embedded applications

Tshagharyan, G.; Harutyunyan, G.; Shoukourian, S.; Zorian, Y.

作者Tshagharyan, G.; Harutyunyan, G.; Shoukourian, S.; Zorian, Y.
文件大小215.04KB
发表时间2017
DOI10.1109/EWDTS.2017.8110065
页码1-4

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