To EVM or Two EVMs?: An Answer to the Question
- 期刊名称IEEE Solid-State Circuits Magazine
- 作者Vigilante, Marco; McCune, Earl; Reynaert, Patrick
- 卷第9卷
- 期第3期
- 印刷ISSN1943-0582
- 文件大小1427.71KB
- 发表时间2017-22
- DOI10.1109/MSSC.2017.2714398
- 页码36-39
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