[IEEE 2017 IEEE 26th Asian Test Symposium (ATS) - Taipei (2017.11.27-2017.11.30)] 2017 IEEE 26th Asian Test Symposium (ATS) - Post Silicon Debugging of Electrical Bugs Using Trace Buffers
- 作者Iwata, Kentaro; Gharehbaghi, Amir Masoud; Tahoori, Mehdi B.; Fujita, Masahiro
- 文件大小327.77KB
- 发表时间2017
- DOI10.1109/ATS.2017.44
- 页码189-194
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