[IEEE 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP) - Fort Worth, TX, USA (2017.10.22-2017.10.25)] 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP) - Voltage endurance test at increasing voltage as a tool to express determinations of mathematical model parameters of electrical aging
Khazanov, Aleksandr; Vakser, Boris; Gegenava, Anna; Moore, P. E. Bill
- 作者Khazanov, Aleksandr; Vakser, Boris; Gegenava, Anna; Moore, P. E. Bill
- 文件大小447.50KB
- 发表时间2017
- DOI10.1109/CEIDP.2017.8257532
- 页码810-815