[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Relaxing DRAM refresh rate through access pattern scheduling: A case study on stencil-based algorithms
Tovletoglou, Konstantinos; Nikolopoulos, Dimitrios S.; Karakonstantis, Georgios
- 作者Tovletoglou, Konstantinos; Nikolopoulos, Dimitrios S.; Karakonstantis, Georgios
- 文件大小375.03KB
- 发表时间2017
- DOI10.1109/iolts.2017.8046197
- 页码45-50