[IEEE 2017 Nirma University International Conference on Engineering (NUiCONE) - Ahmedabad, India (2017.11.23-2017.11.25)] 2017 Nirma University International Conference on Engineering (NUiCONE) - Single missing cell deposition defect analysis of sequential reversible circuit
- 作者Dhare, Vaishali; Mehta, Usha
- 文件大小668.19KB
- 发表时间2017
- DOI10.1109/NUICONE.2017.8325621
- 页码1-4
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