发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Cambridge (2017.10.23-2017.10.25)] 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Region based containers — A new paradigm for the analysis of fault tolerant networks

[IEEE 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Cambridge (2017.10.23-2017.10.25)] 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Region based containers — A new paradigm for the analysis of fault tolerant networks

Joshi, Prashant D.; Sen, Arunabha; Hsu, D. Frank; Hamdioui, Said; Bertels, Koen
  • 作者Joshi, Prashant D.; Sen, Arunabha; Hsu, D. Frank; Hamdioui, Said; Bertels, Koen
  • 文件大小176.15KB
  • 发表时间2017
  • DOI10.1109/DFT.2017.8244442
  • 页码1-4
同作者推荐
← 返回【学霸图书馆】主页
© 2026 学霸图书馆 · 让阅读成为习惯