[IEEE 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Washington, DC, USA (2017.8.7-2017.8.11)] 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - A study on correlation between near-field EMI scan and ESD susceptibility of ICs
Hosseinbeig, Ahmad; Izadi, Omid Hoseini; Shinde, Satyajeet; Pommerenke, David; Shumiya, Hideki; Maeshima, Junji; Araki, Kenji
- 作者Hosseinbeig, Ahmad; Izadi, Omid Hoseini; Shinde, Satyajeet; Pommerenke, David; Shumiya, Hideki; Maeshima, Junji; Araki, Kenji
- 文件大小494.52KB
- 发表时间2017
- DOI10.1109/isemc.2017.8077861
- 页码169-174