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Simulation and investigation of SiPM’s leakage currents at low voltages

Simulation and investigation of SiPM’s leakage currents at low voltages

Parygin, P P; Popova, E V; Grachev, V M
  • 期刊名称Journal of Physics: Conference Series
  • 作者Parygin, P P; Popova, E V; Grachev, V M
  • 卷第798卷
  • 印刷ISSN1742-6588
  • 电子ISSN1742-6596
  • 文件大小533.08KB
  • 发表时间2017-01
  • DOI10.1088/1742-6596/798/1/012221
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