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Intensity-based axial localization approaches for multifocal plane microscopy

Intensity-based axial localization approaches for multifocal plane microscopy

Velmurugan, Ramraj; Chao, Jerry; Ram, Sripad; Ward, E. Sally; Ober, Raimund J.

期刊名称Optics Express
作者Velmurugan, Ramraj; Chao, Jerry; Ram, Sripad; Ward, E. Sally; Ober, Raimund J.
卷第25卷
期第4期
电子ISSN1094-4087
文件大小2917.45KB
发表时间2017-02-20
DOI10.1364/oe.25.003394

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