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Effect of rapid thermal annealing on the structural and electrical properties of RF sputtered CCTO thin film

Effect of rapid thermal annealing on the structural and electrical properties of RF sputtered CCTO thin film

Tripathy, N; Das, K C; Ghosh, S P; Bose, G; Kar, J P
  • 期刊名称IOP Conference Series: Materials Science and Engineering
  • 作者Tripathy, N; Das, K C; Ghosh, S P; Bose, G; Kar, J P
  • 卷第178卷
  • 印刷ISSN1757-8981
  • 电子ISSN1757-899X
  • 文件大小986.97KB
  • 发表时间2017-02
  • DOI10.1088/1757-899X/178/1/012009
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