Quantitative Trait Loci Associated with Anthracnose Resistance in Sorghum

Patil, Nikhil Y.; Klein, Robert R.; Williams, Crescenda L.; Collins, S. Delroy; Knoll, Joseph E.; Burrell, A. Millie; Anderson, William F.; Rooney, William L.; Klein, Patricia E.

期刊名称Crop Science
作者Patil, Nikhil Y.; Klein, Robert R.; Williams, Crescenda L.; Collins, S. Delroy; Knoll, Joseph E.; Burrell, A. Millie; Anderson, William F.; Rooney, William L.; Klein, Patricia E.
卷第57卷
期第2期
电子ISSN0011-183X
文件大小5228.02KB
发表时间2017
DOI10.2135/cropsci2016.09.0793

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Quantitative Trait Loci Associated with Anthracnose Resistance in Sorghum