Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC
- 期刊名称Journal of Electronic Testing
- 作者Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Venini, Federico
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小1607.49KB
- 发表时间2018-2-3
- DOI10.1007/s10836-018-5705-1
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