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A global scheme for controlling the mean and standard deviation of a process based on the optimal design of gauges

A global scheme for controlling the mean and standard deviation of a process based on the optimal design of gauges

Mosquera, Jaime; Aparisi, Francisco; Epprecht, Eugenio Kahn

期刊名称Quality and Reliability Engineering International
作者Mosquera, Jaime; Aparisi, Francisco; Epprecht, Eugenio Kahn
印刷ISSN0748-8017
文件大小730.54KB
发表时间2018-02-22
DOI10.1002/qre.2282

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